[Failure Analysis Page]
IR Camera Imaging
Metallurgical Mechanical and Chemical Analysis
Optical Photos
Fine/Gross Seal Leak / Residual Gas Analysis
PIND (Particle Impact Noise Detection)
Scanning Electron Microscope Imaging
Sample Prep for Imaging
Component De-lid
SAM (Scanning Acoustical Microscopy)
X-Ray Imaging / Radiography
SIMS (Secondary Ion Mass Spectrometry)
Compound / Element Identification
Component & Semi Testing (Incl Radiation Tol.)
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Page Revision: May 22, 2004
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